Conference or Workshop Item

Mavalankar, A; Cameron, J; Gomes, I; Sottini, S; Fohler, M; Soloviev, V; Travish, G; Mingard, K; Minelli, C (2018) Controlling thermal failure of silicon field emitters in a commercial X-ray source. In: 2018 31st International Vacuum Nanoelectronics Conference (IVNC), 9-13 July 2018, Kyoto, Japan.