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Controlling thermal failure of silicon field emitters in a commercial X-ray source

Mavalankar, A; Cameron, J; Gomes, I; Sottini, S; Fohler, M; Soloviev, V; Travish, G; Mingard, K; Minelli, C (2018) Controlling thermal failure of silicon field emitters in a commercial X-ray source. In: 2018 31st International Vacuum Nanoelectronics Conference (IVNC), 9-13 July 2018, Kyoto, Japan.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Advanced Materials > Microstructural Characterisation
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/IVNC.2018.8520090
Last Modified: 22 Jan 2019 13:30
URI: http://eprintspublications.npl.co.uk/id/eprint/8240

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