Mavalankar, A; Cameron, J; Gomes, I; Sottini, S; Fohler, M; Soloviev, V; Travish, G; Mingard, K; Minelli, C (2018) Controlling thermal failure of silicon field emitters in a commercial X-ray source. In: 2018 31st International Vacuum Nanoelectronics Conference (IVNC), 9-13 July 2018, Kyoto, Japan.
Full text not available from this repository.
Official URL: https://doi.org/10.1109/IVNC.2018.8520090
Item Type: | Conference or Workshop Item (Paper) |
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Subjects: | Advanced Materials > Microstructural Characterisation |
Divisions: | Engineering, Materials & Electrical Science |
Identification number/DOI: | 10.1109/IVNC.2018.8520090 |
Last Modified: | 22 Jan 2019 13:30 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8240 |
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