Conference or Workshop Item

Liu, F*; Husain, M K*; Li, Z*; Sotto, M S H*; Burt, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Transport properties in silicon nanowire transistors with atomically flat interfaces. In: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM), 28 February - 2 March 2017, Toyama, Japan.