Publications
Items where Author is "Baltusis, A"
![[up]](/style/images/multi_up.png)
Up a levelGroup by: Item Type | No Grouping
Jump to: Report/Guide
Number of items: 1.
Report/Guide
Koutsourakis, G; Baltusis, A; Wood, S; Blakesley, J; Castro, F A (2022) Feasibility of Novel Wafer Scale Imaging Methods for Identification of Defects in Semiconductors for Net-Zero. NPL Report. TQE 21