Shang, X; Naftaly, M; Skinner, J; Ausden, L; Gregory, A; Ridler, N M; Arz, U; Phung, G N; Ulm, D; Kleine-Ostmann, T; Allal, D; Wojciechowski, M; Kazemipour, A; Gaumann, G; Hudlicka, M (2024) Interlaboratory Comparison of Dielectric Measurements from Microwave to Terahertz Frequencies Using VNA-based and Optical-based Methods. IEEE Transactions on Microwave Theory and Techniques, 72 (11). pp. 6473-6484.

Ausden, L; Stokes, D; Skinner, J; Ridler, N M; Shang, X (2024) Characterisation of Dielectric Substrates at Millimetre-wave and Sub-terahertz Frequencies Using a VNA-based Guided-wave Technique. In: 54th European Microwave Conference, 24-26 September 2024, Paris, France.