Ausden, L; Ridler, N N; Rumiantsev, A; Martens, J; Shang, X (2025) Comparison of Broadband Single-Sweep and Conventional Banded System On-Wafer S-Parameter Measurements up to 220 GHz. In: 2025 105th ARFTG Microwave Measurement Conference (ARFTG), 20 June 2025, San Fransisco, CA, USA.

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Abstract

This paper presents a comparison of on-wafer S-parameter measurements of coplanar waveguide (CPW) devices using broadband single-sweep and conventional banded systems, up to 220 GHz. Three attenuators and a pair of loads on a commercial calibration substrate were measured using these two different types of systems in the same laboratory, and the results are reported and discussed. Overall, good agreement was observed between the two different approaches. This study benchmarks the performance of the single-sweep system against conventional banded systems using on-wafer measurements and provides insights into the equivalence of these methods for other users.

Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Publisher:	IEEE
Identification number/DOI:	10.1109/ARFTG65332.2025.11168146
Last Modified:	15 May 2026 13:09
URI:	https://eprintspublications.npl.co.uk/id/eprint/10398