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Naresh-Kumar, G.; Alasmari, A.; Kusch, G.; Edwards, P.R.; Martin, R.W.; Mingard, K.P.; Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977 ISSN 03043991