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Items where Author is "Aaen, P"

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Votsi, H; Li, C; Aaen, P; Ridler, N M (2017) An active interferometric method for extreme impedance on-wafer device measurements. IEEE Microwave and Wireless Components Letters, 27 (11). pp. 1034-1036.

This list was generated on Thu Oct 21 02:49:26 2021 BST.