Stanley, M; Parker-Jervis, R; de Graaf, S; Lindstrom, T; Cunningham, J E; Ridler, N M (2022) Validating S-parameters measurement of RF integrated circuits at milli-kelvin temperatures. Electronics Letters, 58 (16). pp. 614-616.

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Abstract

Techniques to precisely characterize RF components at mK temperatures support the development of quantum computing systems utilizing these RF components. In this work, an S-parameter measurement setup to characterize RF integrated circuits at mK temperatures has been proposed and for the first time, the S-parameter measurements at mK temperatures have been validated using two independent calibration techniques, thereby providing more confidence in measurements. The techniques are demonstrated experimentally by comparing and validating calibrated S-parameter measurements of a cryogenic attenuator IC at mK temperatures.

Item Type:	Article
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1049/ell2.12545
Last Modified:	20 Nov 2023 14:47
URI:	https://eprintspublications.npl.co.uk/id/eprint/9878