Singh, D; Salter, M J; Johny, S; Ridler, N M (2022) Uncertainties in small-signal and large-signal measurements of RF amplifiers using a VNA. IEEE Instrumentation & Measurement Magazine, 25 (6). pp. 37-44.

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Abstract

Uncertainties in typical small-signal and large-signal amplifier parameters measured using a vector network analyser (VNA) are investigated in this paper. Methods to evaluate the measurement uncertainty in return losses, input power, output power, power gain, 1 dB compression point, etc, based on the use of the VNA dynamic uncertainty option (VNA-DUO) tool from Keysight Technologies are applied to a commercial amplifier between 0.5 GHz and 8 GHz.

Item Type:	Article
Keywords:	Uncertainties, Small-Signal, Large-Signal, Amplifiers, VNA
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/MIM.2022.9847190
Last Modified:	15 Feb 2023 10:23
URI:	https://eprintspublications.npl.co.uk/id/eprint/9645