Lozar, R; Ohlrogge, M; Weber, R; Ridler, N M; Shang, X B; Probst, T; Arz, U (2019) A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies. IEEE Transactions on Microwave Theory and Techniques, 67 (8). pp. 3475-3484. ISSN 0018-9480
Full text not available from this repository.
Official URL: https://doi.org/10.1109/TMTT.2019.2919538
| Item Type: | Article |
|---|---|
| Subjects: | Electromagnetics > RF and Microwave |
| Divisions: | Electromagnetic & Electrochemical Technologies |
| Identification number/DOI: | 10.1109/TMTT.2019.2919538 |
| Last Modified: | 31 Oct 2019 15:20 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/8553 |
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