Clarke, R G; Li, C; Ridler, N M (2017) An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies. In: 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), 28 November 2017 - 01 December 2017, Boulder, CO, USA.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/ARFTG.2017.8255866
Last Modified:	12 Jun 2018 12:52
URI:	https://eprintspublications.npl.co.uk/id/eprint/7925