Votsi, H; Li, C; Aaen, P; Ridler, N M (2017) An active interferometric method for extreme impedance on-wafer device measurements. IEEE Microwave and Wireless Components Letters, 27 (11). pp. 1034-1036.

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Item Type:	Article
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/LMWC.2017.2750086
Last Modified:	08 Mar 2018 15:56
URI:	https://eprintspublications.npl.co.uk/id/eprint/7799