Bosi, G*; Raffo, A*; Avolio, G*; Schreurs, D*; Humphreys, D A (2016) Impact of microwave measurement uncertainty on the nonlinear embedding procedure. In: 87th ARFTG Microwave Measurement Conference, 27 May 2016, San Francisco, USA.

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Abstract

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Electromagnetics Electromagnetics > RF and Microwave
Identification number/DOI:	10.1109/ARFTG.2016.7501953
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/7165