Sinko, J*; Kakonyi, R*; Rees, E*; Metcalf, D*; Knight, A E; Kaminski, C F*; Szabo, G*; Erdelyi, M* (2014) TestSTORM: Simulator for optimizing sample labeling and image acquisition in localization based super-resolution microscopy. Biomed. Opt. Express, 5 (3). pp. 778-787.

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Abstract

Localization-based super-resolution microscopy image quality depends on several factors such as dye choice and labeling strategy, microscope quality and user-defined parameters such as frame rate and number. Experimental optimization of these parameters can be time-consuming and expensive so we present TestSTORM, a simulator that can be used to optimize these steps. In order to do this, the user can select four different structures with specific patterns, dye and acquisition parameters. Example results are shown and the results of the vesicle pattern are compared with experimental data. Moreover, image stacks can be generated for further evaluation using localization algorithms, offering a tool for further software developments.

Item Type:	Article
Keywords:	super-resolution, STORM, simulation, microscopy
Subjects:	Biotechnology Biotechnology > Bio-Diagnostics
Identification number/DOI:	10.1364/BOE.5.000778
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/6148