O'Halleran, K; Shaw, M J (2012) Polarisation effects on contrast in structured illumination microscopy. Opt. Lett., 37 (22). pp. 4603-4605.

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Abstract

In this letter we present an analysis of the effects of polarization state on the pattern contrast in a structured illumination microscope. Using vectorial ray tracing methods we show that the contrast varies non-monotonically with both the numerical aperture of the microscope objective lens and the orientation of the electric field with respect to the meridional plane. By careful selection of these two parameters, high pattern contrast can be obtained without the need for polarization rotation, reducing the cost and complexity of structured illumination imaging systems and increasing light throughput and imaging speed. We present experimental results which show good agreement with theoretical predictions and discuss the implications for super-resolution imaging.

Item Type:	Article
Keywords:	Fluorescence Microscopy, Super-resolution, Polarisation, Geometrical Ray Tracing
Subjects:	Biotechnology Biotechnology > Bio-Diagnostics
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/5677