Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitive measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 87. pp. 159-167.
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| Item Type: | Article |
|---|---|
| Subjects: | Advanced Materials |
| Last Modified: | 02 Feb 2018 13:18 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/509 |
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