Sims, G D; Gnaniah, S J P (2009) VAMAS expands the global reach of materials metrology. ISO Focus, 6 (2). pp. 25-27.

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Abstract

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Item Type:	Article
Keywords:	VAMAS, materials metrology
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/4604