Barwood, G P; Gill, P; Rowley, W R C (1998) High accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes. Meas. Sci. Technol., 9 (7). pp. 1036-41.

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Item Type:	Article
Subjects:	Time and Frequency Time and Frequency > Optical Frequency Standards and Metrology
Last Modified:	02 Feb 2018 13:18
URI:	https://eprintspublications.npl.co.uk/id/eprint/1011