Salter, M; Singh, D; Stant, L (2021) Nonlinear measurements for 5G devices and the associated uncertainties. In: Metrology for 5G and Emerging Wireless Technologies. IET, pp. 55-83. ISBN 9781839532788

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Abstract

This chapter describes a selection of measurement techniques and considerations which address the above challenges presented by 5G RF requirements. The subject matter is divided into the following four sections: RF instrumentation used for common device measurements and the calibration process used to remove their main sources of error; the use of 'load-pull' measurements to characterise the response of power transistors across a range of source and load impedances; X-parameters, a popular nonlinear behavioural model used to capture the response of nonlinear devices for use in design simulations; and practical limitations of RF measurements and techniques for evaluating their associated uncertainties.

Item Type:	Book Chapter/Section
Keywords:	Nonlinear vector network analyser load-pull X-parameters measurement uncertainty
Subjects:	Electromagnetics > Wireless Communications
Divisions:	Electromagnetic & Electrochemical Technologies
Publisher:	IET
Last Modified:	21 Jul 2023 08:54
URI:	https://eprintspublications.npl.co.uk/id/eprint/9792