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An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)

Koko, A; Tong, V; Wilkigson, A J; Marrow, T J (2023) An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD). Ultramicroscopy, 248. 113705

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Abstract

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.

Item Type: Article
Keywords: EBSD; strain; HR-EBSD
Subjects: Advanced Materials > Microstructural Characterisation
Divisions: Materials and Mechanical Metrology
Identification number/DOI: 10.1016/j.ultramic.2023.113705
Last Modified: 02 May 2023 13:55
URI: http://eprintspublications.npl.co.uk/id/eprint/9696

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