Koko, A; Tong, V; Wilkigson, A J; Marrow, T J (2023) An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD). Ultramicroscopy, 248. 113705
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Abstract
For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated in plastically deformed body-centred cubic and face-centred cubic ductile metals (ferrite and austenite grains in duplex stainless steel) and brittle single-crystal silicon, which showed that the effect is not only limited to measurement magnitude but also spatial distribution. An empirical relationship was then identified between the cross-correlation parameter and angular error, which was used in an iterative algorithm to identify the optimal reference pattern that maximises the precision of HR-EBSD.
Item Type: | Article |
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Keywords: | EBSD; strain; HR-EBSD |
Subjects: | Advanced Materials > Microstructural Characterisation |
Divisions: | Materials and Mechanical Metrology |
Identification number/DOI: | 10.1016/j.ultramic.2023.113705 |
Last Modified: | 02 May 2023 13:55 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/9696 |
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