Zhang, Q; Loh, T H; Zhou, D; Shen, F; Huang, Z; Qin, F (2023) A Measurement Campaign of Industrial Environment for Ultra Reliable IIoT Systems. In: 14th International Conference on Wireless Communications and Signal Processing (WCSP 2022), 1-3 November 2022, Nanjing, China.

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Abstract

The large-scale deployment of Industrial Internet of Things (IIoT) is still facing the challenge of providing reliable service with wireless networks, which is envisaged due to the severe multipath fading caused by numerous metal reflectors in industrial environments. Therefore, the channel measurement for different multipath fading scenarios is an important part of exploring the channel characteristics of industrial environments. In this paper, we measured the wideband channel characteristics of a microelectronic manufacturing and a classroom environment with the similar volume. The comparison between them has demonstrated the essential empirical characterisations of wireless industrial channel. Based on these findings, we then propose an empirical PDP model and investigate the root mean square delay spread and coherent bandwidth in these two scenarios, which enabling insight understanding of the channel characteristics and the deployment of IIoT systems operating in industrial scenarios.

Item Type:	Conference or Workshop Item (Paper)
Keywords:	industrial fading channel, power delay profile, Rician distribution, delay spread
Subjects:	Electromagnetics > Wireless Communications
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1109/WCSP55476.2022.10039245
Last Modified:	27 Feb 2023 09:27
URI:	https://eprintspublications.npl.co.uk/id/eprint/9674