Hu, X; Dai, G; Sievers, S; Fernández-Scarioni, A; Corte-Leon, H; Puttock, R; Barton, C; Kazakova, O; Ulvr, M; Klapetek, P; Havlíček, M; Nečas, D; Tang, Y; Neu, V; Schumacher, H W (2020) Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. Journal of Magnetism and Magnetic Materials, 511. 166947 ISSN 03048853
Full text not available from this repository.
Official URL: https://doi.org/10.1016/j.jmmm.2020.166947
| Item Type: | Article |
|---|---|
| Subjects: | Quantum Phenomena > Nanophysics |
| Divisions: | Quantum Technologies |
| Identification number/DOI: | 10.1016/j.jmmm.2020.166947 |
| Last Modified: | 14 Oct 2020 13:19 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/8892 |
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