Winklemann, A; Jablon, B M; Tong, V S; Troger-Cowan, C; Mingard, K P (2020) Improving EBSD precision by orientation refinement with full pattern matching. Journal of Microscopy, 277 (2). pp. 79-92. ISSN 0022-2720

Full text not available from this repository.

Item Type:	Article
Subjects:	Advanced Materials > Microstructural Characterisation
Divisions:	Engineering
Identification number/DOI:	10.1111/jmi.12870
Last Modified:	25 Jun 2020 15:02
URI:	https://eprintspublications.npl.co.uk/id/eprint/8753