Havelund, R; Seah, M P; Gilmore, I S (2019) SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles. Surface and Interface Analysis, 51 (13). pp. 1332-1341. ISSN 0142-2421

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Item Type:	Article
Subjects:	Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical & Biological Sciences
Identification number/DOI:	10.1002/sia.6701
Last Modified:	07 Jan 2020 14:54
URI:	https://eprintspublications.npl.co.uk/id/eprint/8613