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Electromagnetic Metrology for Nano- Electromechanical Systems

Hao, L; Gallop, J C; Chen, J (2019) Electromagnetic Metrology for Nano- Electromechanical Systems. IEEE Transactions on Instrumentation and Measurement, 68 (6). pp. 1827-1832. ISSN 0018-9456

Full text not available from this repository.
Item Type: Article
Subjects: Quantum Phenomena > Nanophysics
Divisions: Quantum Technologies
Identification number/DOI: 10.1109/TIM.2018.2879068
Last Modified: 12 Jul 2019 13:32
URI: http://eprintspublications.npl.co.uk/id/eprint/8439

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