Hao, L; Gallop, J C; Chen, J (2019) Electromagnetic Metrology for Nano- Electromechanical Systems. IEEE Transactions on Instrumentation and Measurement, 68 (6). pp. 1827-1832. ISSN 0018-9456

Full text not available from this repository.

Item Type:	Article
Subjects:	Quantum Phenomena > Nanophysics
Divisions:	Quantum Technologies
Identification number/DOI:	10.1109/TIM.2018.2879068
Last Modified:	12 Jul 2019 13:32
URI:	https://eprintspublications.npl.co.uk/id/eprint/8439