Giblin, S P; Drung, D; Gotz, M; Scherer, H (2019) Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty. IEEE Transactions on Instrumentation and Measurement, 68 (6). pp. 1996-2002. ISSN 0018-9456
Full text not available from this repository.
Official URL: https://doi.org/10.1109/TIM.2018.2879126
| Item Type: | Article |
|---|---|
| Subjects: | Quantum Phenomena > Nanophysics |
| Divisions: | Quantum Technologies |
| Identification number/DOI: | 10.1109/TIM.2018.2879126 |
| Last Modified: | 27 Jun 2019 14:39 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/8438 |
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