Giblin, S P (2018) Re-evaluation of uncertainty for calibration of 100 MΩ and 1 GΩ resistors at NPL. Metrologia, 56 (1). 015014 ISSN 0026-1394
Full text not available from this repository.
Official URL: https://doi.org/10.1088/1681-7575/aaf52d
| Item Type: | Article |
|---|---|
| Subjects: | Quantum Phenomena > Nanophysics |
| Divisions: | Quantum Science |
| Identification number/DOI: | 10.1088/1681-7575/aaf52d |
| Last Modified: | 19 Feb 2019 11:54 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/8307 |
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