Mavalankar, A; Cameron, J; Gomes, I; Sottini, S; Fohler, M; Soloviev, V; Travish, G; Mingard, K; Minelli, C (2018) Controlling thermal failure of silicon field emitters in a commercial X-ray source. In: 2018 31st International Vacuum Nanoelectronics Conference (IVNC), 9-13 July 2018, Kyoto, Japan.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Advanced Materials > Microstructural Characterisation
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/IVNC.2018.8520090
Last Modified:	22 Jan 2019 13:30
URI:	https://eprintspublications.npl.co.uk/id/eprint/8240