< back to main site

Publications

Electromagnetic Metrology for NEMS

Hao, L; Gallop, J; Chen, J (2018) Electromagnetic Metrology for NEMS. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Quantum Phenomena > Nanophysics
Divisions: Quantum Science
Identification number/DOI: 10.1109/CPEM.2018.8500917
Last Modified: 10 Jan 2019 15:36
URI: http://eprintspublications.npl.co.uk/id/eprint/8233

Actions (login required)

View Item View Item