Thomas, S A; Jin, Y; Bunch, J; Gilmore, I S (2017) Enhancing classification of mass spectrometry imaging data with deep neural networks. In: 2017 IEEE Symposium Series on Computational Intelligence (SSCI), 27 November - 01 December 2017, Honolulu, HI, USA.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical, Medical & Environmental Science
Identification number/DOI:	10.1109/ssci.2017.8285223
Last Modified:	26 Jun 2018 14:46
URI:	https://eprintspublications.npl.co.uk/id/eprint/8011