Mingard, K; Stewart, M; Gee, M G; Vespucci, S; Trager-Cowan, C (2018) Practical application of direct electron detectors to EBSD mapping in 2D and 3D. Ultramicroscopy, 184. pp. 242-251.

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Item Type:	Article
Subjects:	Advanced Materials > Microstructural Characterisation
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1016/j.uktramic.2017.09.008
Last Modified:	16 Apr 2018 13:35
URI:	http://eprintspublications.npl.co.uk/id/eprint/7835

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