< back to main site

Publications

Sample rotation improves gas cluster sputter depth profiling of polymers

Smith, E F; Counsell, J D P; Bailey, J; Sharp, J S; Alexander, M R; Shard, A; Scurr, D J (2017) Sample rotation improves gas cluster sputter depth profiling of polymers. Surface and Interface Analysis, 49 (10). pp. 953-959.

Full text not available from this repository.
Item Type: Article
Subjects: Nanoscience > Surface and Nanoanalysis
Divisions: Chemical, Medical & Environmental Science
Identification number/DOI: 10.1002/sia.6250
Last Modified: 28 Feb 2018 15:23
URI: http://eprintspublications.npl.co.uk/id/eprint/7741

Actions (login required)

View Item View Item