Humphreys, D A; Fatadin, I; Bieler, M; Struszewski, P; Hudlicka, M (2017) Optical and RF metrology for 5G. In: 2017 IEEE Photonics Society Summer Topical Meeting Series (SUM), 10-12 July 2017, San Juan, Puerto Rico.

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Abstract

Specification standards will soon be available for 5G mobile RF communications. What optical and electrical metrology is needed or available to support the development of the supporting optical communication systems? Device measurement, digital oscilloscope impairments and improving system resolution are discussed.

Item Type:	Conference or Workshop Item (Paper)
Keywords:	5G, Photodiodes, Digital Real-Time Oscilloscope, Error Vector Magnitude
Subjects:	Electromagnetics > Wireless Communications
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/PHOSST.2017.8012717
Last Modified:	13 Feb 2018 14:00
URI:	https://eprintspublications.npl.co.uk/id/eprint/7703