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Long-term stability evaluation of a Sn-doped Ni-C eutectic cell suitable for radiation thermometry.

Teixeira, R N*; Machin, G (2017) Long-term stability evaluation of a Sn-doped Ni-C eutectic cell suitable for radiation thermometry. Int. J. Thermophysics, 38 (6). p. 80.

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Abstract

Metal carbon eutectic cells are being developed as high temperature references for radiation and contact thermometry above the copper freezing point (1084.62 °C). Recent studies have demonstrated the concept of using doped metal carbon eutectic cells as temperature scale comparison artefacts. When using such artefacts, the participating laboratories do not know the phase transition temperature of the eutectic cell, because it has been slightly changed by the addition of a selected dopant at a definite concentration. This is an example of a blind comparison and it is useful for evaluating the real measurement capability of the laboratories in the comparison.

The Pyrometry Laboratory of Inmetro (Brazil) developed a set of doped Ni-C eutectic cells in 2012 and 2013 as part of PhD studies. The work reported here gives the results of a long-term stability evaluation of a Sn doped Ni-C cell constructed in 2012, which has accumulated more than 250 hours above 1300 °C and more than 50 cycles of melts and freezes. This cell showed excellent stability throughout the evaluation period, with negligible temperature changes, all well within the measurement uncertainty.

This work describes the construction of the Sn doped Ni-C eutectic cell, the instrumentation used for the measurements and presents an analysis of the results including an examination of the uncertainties associated with the measurements.

Item Type: Article
Keywords: High temperature fixed points, stability, effect of impurities
Subjects: Engineering Measurements
Engineering Measurements > Thermal
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1007/s10765-017-2205-y
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7541

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