Kumar, N; Zoladek-Lemanczyk, A; Guilbert, A A Y*; Su, W T*; Tuladhar, S M*; Kirchartz, T*; Schroeder, B C*; McCulloch, I*; Nelson, J*; Roy, D; Castro, F A (2017) Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale. Nanoscale, 9 (8). pp. 2723-2731.

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Abstract

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical, Medical & Environmental Science
Identification number/DOI:	10.1039/c6nr09057e
Last Modified:	09 Feb 2018 13:54
URI:	https://eprintspublications.npl.co.uk/id/eprint/7439