Winiarski, B; Gholinia, A*; Mingard, K; Gee, M; Thompson, G E*; Withers, P J* (2017) Broad ion beam serial section tomography. Ultramicroscopy, 172. pp. 52-64.

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Item Type:	Article
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Identification number/DOI:	10.1016/j.ultramic.2016.10.014
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/7370

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