Bosi, G*; Raffo, A*; Avolio, G*; Schreurs, D*; Humphreys, D A (2016) Impact of microwave measurement uncertainty on the nonlinear embedding procedure. In: 87th ARFTG Microwave Measurement Conference, 27 May 2016, San Francisco, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Identification number/DOI: | 10.1109/ARFTG.2016.7501953 |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7165 |
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