Van Nuffel, S*; Parmenter, C*; Scurr, D J*; Russell, N A*; Zelzer, M (2016) Multivariate analysis of 3D ToF-SIMS images: method validation and application to cultured neuronal networks. Analyst, 141 (1). pp. 90-95.
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Item Type: | Article |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Identification number/DOI: | 10.1039/c5an01743b |
Last Modified: | 02 Feb 2018 13:13 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/6953 |
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