Van Nuffel, S*; Parmenter, C*; Scurr, D J*; Russell, N A*; Zelzer, M (2016) Multivariate analysis of 3D ToF-SIMS images: method validation and application to cultured neuronal networks. Analyst, 141 (1). pp. 90-95.

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Abstract

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1039/c5an01743b
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/6953