Appino, C*; Ferrara, E*; Fiorillo, F*; Rocchino, L*; Ragusa, C*; Sievert, J*; Belgrand, T*; Wang, C*; Denke, P*; Siebert, S*; Norgren, Y*; Gramm, K*; Norman, S*; Lyke, R*; Albrecht, M*; Zhou, X*; Fan, W*; Guo, X*; Hall, M J (2015) International comparison on SST and Epstein measurements in grain-oriented Fe-Si sheet steel. Int. J. Appl. Electrom. Mechan., 48 (2-3). pp. 123-133.

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Item Type:	Article
Subjects:	Electromagnetics Electromagnetics > Electromagnetic Materials
Identification number/DOI:	10.3233/JAE-151978
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/6758