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Tailoring of domain wall devices for sensing applications.

Corte-Leon, H; Krzysteczko, P*; Schumacher, H W*; Manzin, A*; Antonov, V*; Kazakova, O (2014) Tailoring of domain wall devices for sensing applications. IEEE Trans. Magn., 50 (11). 7101004

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We perform magnetoresistance (MR) measurements to experimentally track magnetic domain wall (DW) pinning/depinning process in L-shaped Permalloy (Py) nanostructures with widths in the range 50 - 400 nm. We demonstrate that the field interval between pinning/depinning events increases with the reduction of the nanowire width. The most reproducible measurements are obtained from the narrowest devices. MR measurements reveal that the stochastic contribution to pinning/depinning processes is higher when the applied field is oriented symmetrically with respect to both arms of the device. The interpretation of experimental results is supported by micromagnetic simulations.

Item Type: Article
Subjects: Quantum Phenomena
Quantum Phenomena > Nanophysics
Identification number/DOI: 10.1109/TMAG.2014.2327803
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6495

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