Wernecke, J*; Shard, A G; Krumrey, M* (2014) Traceable thickness determination of organic nanolayers by X-ray reflectometry. Surf. Interface Anal., 46 (10-11). pp. 911-914.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1002/sia.5371
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/6471