Seah, M P (2014) Summary of ISO/TC 201 standard: ISO 18115-1:2013 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy. Surf. Interface Anal., 46 (5). pp. 357-360.

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Abstract

Amendments have been made to International Standard ISO 18115-1:2010 extending the number of terms and, in a few cases where usage has changed, incorporating revisions. Part 1 covers 600 terms used in Auger electron spectroscopy, elastic peak electron spectroscopy, reflected electron energy loss spectroscopy, secondary ion mass spectrometry, ultra-violet photoelectron spectroscopy, X-ray photoelectron spectroscopy, etc as well as 75 acronyms. The terms cover words or phrases used in describing the samples, instruments and theoretical concepts involved in surface chemical analysis.

Item Type:	Article
Keywords:	AES, AFM, instrumentation, samples, SIMS, surface analysis, terminology, vocabulary, XPS
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1002/sia.5475
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/6180