Roy, D; Rae, A (2013) Prospects of emerging Raman scattering tools for surface and nanoanalysis. MAPAN, J. Metrol. Soc. India, 28 (4). pp. 285-297.
Full text not available from this repository.Abstract
The demand for label free chemical characterisation in ambient conditions is ever increasing. There is only handful of ambient techniques that can provide chemical and structural information at the nanometre length scale. Raman scattering has proven to be a key tool for surface and nanoanalysis for micro to the nanoscale characterisation. This article gives an overview of the emerging Raman scattering tools, current state of the art, applications and standardisation requirement for the technique.
Item Type: | Article |
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Keywords: | Raman scattering, metrology, surface and nanoanalysis |
Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Identification number/DOI: | 10.1007/s12647-013-0092-7 |
Last Modified: | 02 Feb 2018 13:14 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/6057 |
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