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Magnetic scanning probe calibration using graphene Hall sensor.

Panchal, V; Iglesias-Freire, O*; Lartsev, A*; Yakimova, R*; Asenjo, A*; Kazakova, O (2013) Magnetic scanning probe calibration using graphene Hall sensor. IEEE Trans. Magn., 49 (7). pp. 3520-3523.

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Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (Bprobe) for quantitative measurements. We present a straightforward calibration of Bprobe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined Bprobe ~70 mT and ~76 mT for probes with magnetic moment ~1×10-13 and >3×10-13 emu, respectively, at a probe-sample distance of 20 nm.

Item Type: Article
Keywords: Epitaxial graphene, Hall sensor, Kelvin probe force microscopy, magnetic probe calibration
Subjects: Quantum Phenomena
Quantum Phenomena > Nanophysics
Identification number/DOI: 10.1109/TMAG.2013.2243127
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5895

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