Pearce, R E; Eriksson, J*; Iakimov, T*; Hultman, L*; Spetz, A L*; Yakimova, R (2013) On the differing sensitivity to chemical gating of single and double layer epitaxial graphene explored using Scanning Kelvin Probe Microscopy. ACS Nano, 7 (5). pp. 4647-4656.

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Abstract

Using Environmental Scanning Kelvin Probe Microscopy we show that the position of the Fermi level of single layer graphene is more sensitive to chemical gating than that of double layer graphene. The findings imply that single layer graphene is a more sensitive gas sensor than double layer graphene. We propose that the difference in surface potential between adsorbate-free single and double layer graphene, measured using scanning kelvin probe microscopy, can be used as a non-invasive method of estimating substrate-induced doping in epitaxial graphene.

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Nano-Materials
Identification number/DOI:	10.1021/nn3052633
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/5858