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Far-field scatter measurements of planar optical waveguides using a variable launch system.

Ferguson, R A; Fatadin, I; Harris, S; Allerton, J (2013) Far-field scatter measurements of planar optical waveguides using a variable launch system. In: International Conference on Photonics, Optics and Laser Technology (PHOTOPTICS 2013), 20-21 February 2013, Barcelona, Spain.

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Abstract

Polymer planar optical waveguides fabricated onto electrical printed circuit boards are an emerging technology to provide high-speed communications on computer backplanes. Along with the key parameters of attenuation and isolation, the variable launch system developed at NPL can now be used to measure the transmitted scatter profile of optical printed circuit boards (OPCB's) in order to explore the relationship between launch condition, waveguide and end-face quality. In this paper we describe the modifications to the existing NPL system and measurements of the far-field intensity profiles of a group of reference waveguides using a variety of spot sizes and numerical apertures.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: OPCB, Waveguides, Far-field, Scatter
Subjects: Optical Radiation and Photonics
Optical Radiation and Photonics > Optical Comms. And Data
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5838

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