Chunnilall, C J; Theocharous, E (2012) Infrared hemispherical reflectance measurements in the 2.5 µm to 50 µm wavelength region using an Fourier transform spectrometer. Metrologia, 49 (2). S73-S80

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Abstract

The NPL hemispherical-directional reflectance facility has recently been upgraded, the most significant change being the replacement of the grating spectrophotometer with a Fourier transform spectrometer. Other improvements include better alignment (using visible radiation), the use of an intermediate field stop, minimisation of the effects of heating of the test sample, and correcting for instrumental and relay optics drift by using a blackbody. Measurements obtained with the new facility are presented and discussed.

Item Type:	Article
Subjects:	Optical Radiation and Photonics Optical Radiation and Photonics > Materials and Appearance
Identification number/DOI:	10.1088/0026-1394/49/2/S73
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/5429

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